Characterization of Semiconductor Components
Contamination Inspection and Testing
Electronic Contamination Inspection and Testing allows ECS to help clients with their cleanliness and contamination-related questions. We have on-site facilities for inspecting electronic components and assemblies, using a microscope and camera system connected to a computer for image analysis and archival. Surface cleanliness can be assessed, using our in-house C3 tester for ionic contamination concentration.
ECS also has resources for further tests, such as ion chromatography to determine the nature and concentration of ions on the board or component, as well as cross-sectioning and SEM/EDS. The in-house work is conducted in a 240 sq ft contained environment, maintained to better than ISO Class 8 cleanroom requirements.